Staff: P. Petrik, M. Fried, T. Lohner, M. Serényi, E. Agocs, B. Kalas, A. Romanenko,

Publications, Projects, Equipment, History, Contact, Cooperations, Staff

Biomaterials and Bioellipsometry


Ni detection in water using flagellar nanotubes


Membrane-based flow cell for mid-infrared ellipsometry


Hemicylindrical plasmon-enhanced Kretschmann ellipsometry

Plasmon-enhanced two-channel, multi-angle in situ spectroscopic ellipsometry

Combination of ellipsometry with waveguide interferometry

Multiple angle of incidence, spectroscopic, plasmon-enhanced, internal reflection ellipsometry for the characterization of solid-liquid interface processes


SE vs XRF on fibrinogen monolayers

In-depth characterization and computational 3D reconstruction of flagellar filament protein layer structure based on in situ spectroscopic ellipsometry measurements

In situ ellipsometric study of surface immobilization of flagellar filaments

In situ spectroscopic ellipsometry study of protein immobilization on different substrates using liquid cells

Polymer layers for biosensor applications

Mapping

Composition-dependent optical properties of SiGe

Expanded beam spectro-ellipsometry for big area on-line monitoring

Fast optical monitoring of thin films on large surfaces


Interface of e-beam-irradiated Al2O3


Optical characterization of patterned films

Nanostructures

  Substrate damage by radiofrequency sputtering


Ellipsometry of oxidized porous Si in the ultraviolet-visible-mid infrared spectral range


In-depth cavity distribution

Spectroscopic ellipsometry of columnar porous Si thin films and Si nanowires


Sol-gel nanostructured indium-tin-oxide

Ge nanoclusters embedded in ZrO2

Glazed ceramics by optical and ion beam analysis

Titanate nanotube films

Photonic structures

Resolving lateral and vertical structures by ellipsometry using wavelength range scan

Fourier ellipsometry – an ellipsometric approach to Fourier scatterometry


Coherent Fourier scatterometry

Optical Models for the Characterization of Silica Nanosphere Monolayers Prepared by the Langmuir-Blodgett Method Using Ellipsometry in the Quasistatic Regime

Reconstruction of sub-wavelength features and nano-positioning of gratings using coherent Fourier scatterometry

Fourier vs goniometric scatterometry

Photovoltaics

Expanded-beam optical mapping for large-are photovoltaics

In line optical mapping for roll-to-roll thin-film photovoltaics

Optical modeling

Combined ellipsometry -- X-ray photoelectron spectroscopy approach

Effective medium modeling of finite element-generated surface roughness

Approaches to calculate the dielectric function of ZnO around the band gap

Parameterization of the dielectric function of semiconductor nanocrystals

ZnO by optical and X-ray methods

Model dielectric function analysis of silicon nanocrystal films

Optical metrology for optoelectronics

Optical properties

Composition-dependent optical properties of SiGe

Polymers with tunable refractive index

Hydrophilized poly(lactic-co-glycolic acid) layers with various thicknesses

Optical properties of strain modified NaNbO3 thin films

Optical properties of Zr and ZrO2

Optical indium tin oxide characterization

Hidrogenation by plasma immersion ion implantation

Nanocrystalline diamond

Reflectometry on ZnO

Optical properties of Al2O3

Highly transparent ITO films

As-Se-Te glasses

Optical properties of the Bi4Ti3O12–Na0.5Bi0.5TiO3 system

Waveguide characterizations

High-density Er doping with femtosecond laser plasma

Doping silica beyond limits with laser plasma for active photonic materials

MeV energy N-implanted planar optical waveguides


Injection molding waveguide


Formation of slab waveguides by N implantation in BGO and CaF2


Barrier-type slab waveguide

Books and lectures

Structural investigation techniques in materials science: Ellipsometry

Nanocrystals: Synthesis, Characterization and Applications

Ellipsometry of semiconductor nanocrystals

Felületek és vékonyrétegek vizsgálata polarizált fénnyel (Characterization of surfaces and thin films using polarized light) - University lecture in Hungarian

Symposium on Materials Science (2021)

Symposium on Materials Science (2022)

Projects

Equipment

Rotating compensator spectroscopic ellipsometer from the Woollam company in the wavelenth range of 190-1700 nm with an automatic goniometer and and automatic sample stage. Focusing works down to 0.15 mm. The measurement time is a couple of seconds per spot.

Mid-infra red ellipsometer from the Woollam company in the wavelenth range of 1700 nm to 30000 nm with an automatic goniometer.

We are continuously developing equipment for large area mapping applications. For more results see section Mapping

Double-monocromator rotating polarizer spectroscopic ellipsometer in the wavelength range of 250-850 nm. The spot size is about 1 mm. Especially well suited for high spectral resolution measurements, for which the speed is not an important requirement. New generations of this ellipsometer is currently developed by Semilab

History

The activities of the Ellipsometry Laboratory of the Institute for Technical Physics and Materials Science in the Centre for Energy Research of the Hungarian Academy of Sciences (MTA EK MFA) span more than 30 years, dating back to the early ‘80s when Tivadar Lohner started optical characterizations of the crystal damage in ion-implanted single-crystalline silicon. The research of the Laboratory has a unique focus on the investigations of disorder in bulk and thin film materials created by methods including ion implantation and deposition. Optical models have been developed to improve ellipsometric methodology of multi-component material systems in a vertically changing structure. In the past decade the group has been active in the fields of surface characterizations and bioellipsometry as well. The bioellipsometry activities include the development of liquid cells and optical models for the in situ ellipsometric measurement of protein immobilization. Overall, the Ellipsometry Laboratory has published nearly 300 papers and 3 book chapters, participated in numerous international and national projects, and was the co-organizer of the 3rd International Conference on Spectroscopic Ellipsometry. Besides several self-made and commercial ellipsometers, the main tool of the Laboratory is a Woollam M2000DI automatic rotating compensator ellipsometer operating in the wavelength range of 190-1700 nm.

Contact

Visiting Address:     H-1121 Budapest, Konkoly Thege Miklós út 29-33, Hungary
Mailing Address:   P.O.Box 49, H-1525 Budapest, Hungary
Phone:   (+36-1) 392-2502
Fax:   (+36-1) 392-2226
Email:   petrik.peter@energia.mta.hu
fried.miklos@energia.mta.hu
lohner.tivadar@energia.mta.hu
Location:   The Ellipsometry Laboratory is located in room 215 of building 26 in the KFKI Campus in Csillebérc. You can reach the campus as described here.

Cooperations

Staff

    Péter Petrik, DSc
    Thin films and materials science
    In-situ ellipsometry

    Miklós Fried, DSc
    Development of mapping ellipsometry, ion implantation,
    backscattering spectrometry, surface modifications, porous silicon,
    surface modifications, porous silicon, materials science for photovoltaics

    Tivadar Lohner, DSc
    Ion implantation, nanostructures, quality management,
    backscattering spectrometry, poly/nanocrystalline semiconductors,
    dielectric thin films, porous silicon

    György Juhász, Dr. Univ.
    Hardware development
    Development of divergent beam mapping ellipsometry

    Emil Agócs, PhD
    Nanostructures, bioellipsometry,
    Ellipsometry of complex,
    nanocrystalline semiconductors

    Benjamin Kalas, PhD student
    Bioellipsometry,
    Special flow cell desing, interface processes

    Alekszej Romanenko, PhD student
    Bioellipsometry

    Deshabrato Mukherjee, PhD student
    In-situ ellipsometry

    Petra Bácsics, student
    Electrochemical and optical characterization

    Zoltán Kovács, student
    Bioellipsometry

    Máté Szűcs, student
    Electrochemical and optical characterization

    Bálint Fodor, PhD student
    (2009-2018)
    Nanostructures,
    Model development for the characterization
    of ordered surface structures

    Alex Szendrei, student
    (2016-2018)
    Bioellipsometry

    Enikő Molnár, student
    (2015-2018)
    Bioellipsometry

    Bálint Éles, student
    (2014-2017)
    Ellipsometry, scatterometry

    Judit Nádor, PhD
    (2013-2016)
    Label-free optical metrology,
    Biosensors, bioellipsometry

    Csaba Major, PhD
    (2005-2016)
    Hardware development
    Mapping ellipsometry

    Péter Kozma, PhD
    (2008-2016)
    Development of optical waveguide sensors,
    protein immobilization, in situ bioellipsometry,
    development of liquid cells

    Olivér Polgár, PhD
    (1995-2015)
    Software development
    Evaluation and parameter search algorithms
    Mapping ellipsometry

    Olivia Kozák, student
    (2014-2015)
    Bioellipsometry

    Miklós Dióssy, student
    (2013-2014)
    Tuning of refractive index by nanoparticles

    Milán Janosov, student
    (2011-2013)
    Bioellipsometry
    Instrumentation for combined
    ellipsometry and interferometry

    István Mohácsi, student
    (2010-2011)
    Ion implantation
    Modelling of disorder in low energy ion implantation

    Veronika Cotrau, student
    (2010-2013)
    Bioellipsometry
    Protein immobilization and in situ bioellipsometry

    Zoltán Betyák, student
    (2009-2010)
    Ion implantation
    Disorder by ion implantation in silicon carbide

    Andrea Németh, student
    (2008-2012)
    Bioellipsometry
    Protein immobilization, in situ bioellipsometry

    Tímea Hülber, student
    (2008-2009)
    Bioellipsometry
    Protein immobilization, in situ bioellipsometry

Last update: August, 2021